Detection of nickel-induced stress using laser-induced fluorescence signatures from leaves of wheat seedlings

Wed, 02/03/2010 - 21:08 — Svend Tveden-Nyborg

Publication Type:

Journal Article

Authors:

Mishra, K.B.; R. Gopal, R.

Source:

International J Remote Sens., Volume 29, p.157-173 (2008)